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  ZEISS Elyra 7 with Lattice SIM Introduced

ZEISS Elyra 7ZEISS is introducing ZEISS Elyra 7 with Lattice SIM, a new flexible platform for fast and gentle 3D superresolution. Lattice SIM expands the possibilities of structured illumination microscopy (SIM): illuminating the sample with a lattice pattern rather than grid lines gives higher contrast and allows a more robust image reconstruction. Scientists can use 2x higher sampling efficiency to lower the illumination dosage to observe fast cellular processes in superresolution....

 

  ZEISS Mineralogic v1.6 Offers a Bumper Range of New Capabilities

ZEISS Mineralogic Mining for automated mineral analysisZEISS announces its biggest new release of the ZEISS Mineralogic software at the Process Mineralogy '18 conference in Cape Town, South Africa. This is the 7th instalment of ZEISS Mineralogic since the software was brought to the market in July 2014 and represents a significant advancement in both features and productivity. The software is already well known for providing quantitative mineralogy with the...

 

  ZEISS and arivis AG Partner to Provide Leading 3D Imaging Systems

clearingwhole mouse LightsheetNew microscopy technologies, such as light sheet fluorescence microscopy (LSFM) or clearing methods, allow the imaging of large samples at high resolution or high frame rates. Handling, processing, and analyzing these multi-terabyte data sets has become increasingly difficult for scientists, e.g. in developmental biology and neuroscience. New tools are needed to overcome these challenges. Therefore, EISS has teamed up with arivis AG to offer complete solutions from initial image acquisition to final results...

 

  Leveraging ZEISS Airyscan to Integrate Subcellular and Structural Detail with Inscopix Functional Neural Network Data

zeissAt the Annual Meeting of the Society for Neuroscience 2018 (Nov 03 – 07), ZEISS presented new workflows in collaboration with Inscopix (Palo Alto, CA) where ZEISS’s Airyscan confocal imaging technology is leveraged with the Inscopix freely behaving microscopy systems. The joint workflow development utilizes the increased spatial resolution, signal-to-noise and sectioning of ZEISS Airyscan to further inform the freely behaving signaling data collected with the Inscopix system....

 

  ZEISS and arivis AG Intensify Strategic Partnership

arivis-zeissJoint further development of 3D visualizations of multidimensional image data. ZEISS and arivis have now expanded and deepened their cooperation, which began in 2014. The companies are pursuing the common goal of enabling new findings in life sciences and in materials research by improving the presentation and analysis of digital data. Modern microscope systems with high-resolution optics record ever increasing amounts of data, which can only be displayed and analyzed with the help of advanced software...

 

  New Focal Charge Compensation Mode for ZEISS Field Emission Scanning Electron Microscopes Improves Image Quality

Rat spinal FCCHigh resolution 3D block face imaging for biological samples with fast acquisition rates and minimal sample damage. In collaboration with the National Center for Microscopy and Imaging Research (NCMIR) at the University of California San Diego, ZEISS releases a new Focal Charge Compensation module for block face imaging with ZEISS GeminiSEM and 3View® from Gatan, Inc. Focal Charge Compensation...

 

  ZEISS Presents Initial Release of APEER, its Digital Microscopy Platform for Applications in Science and Industry

ZEISS showcases APEERZEISS presents the initial release of its cloud-based digital microscopy platform, known under the name APEER at the Microscopy & Microanalysis conference (M&M) in Baltimore, USA. Microscopy users will be able to automatically process images in the cloud by leveraging application workflows for 3D reconstructions, staining or segmenting...

 

  ZEISS Expands X-Ray Imaging Portfolio with ZEISS Xradia Context microCT

Xradia ContextZEISS expands X-ray imaging portfolio with ZEISS Xradia Context microCT. Built on renowned ZEISS Xradia platform and field-convertible to ZEISS Xradia Versa X-ray microscope. ZEISS introduces a new X-ray imaging instrument, ZEISS Xradia Context microCT, a large field-of-view, non-destructive 3D X-ray microcomputed tomography system. ZEISS Xradia Context is built on time-tested ZEISS Xradia technology, reaping crossover benefits of years of...

 

  ZEISS Introduces Machine Learning Capability for Microscopy

Low-contrast-mining-mineralogy-grainsFirst ZEISS ZEN Intellesis solution enables segmentation of correlative microscopy datasets. ZEISS recently announced ZEISS ZEN Intellesis, a new machine learning capability that enables researchers to perform advanced analysis of their imaging samples across multiple microscopy methods. The first algorithmic solution introduced by the...

 

  New Field Emission Scanning Electron Microscope ZEISS GeminiSEM 450 Introduced

ZEISS GeminiSEM 450Addressing the highest demands in imaging and analytics from any sample. ZEISS introduces its new field emission scanning electron microscope (FE-SEM) ZEISS GeminiSEM 450. The instrument combines ultrahigh resolution imaging with the capability to perform advanced analytics while maintaining flexibility and ease-of-use...

 

  ZEISS hosts Day of Microscopy 2018

zeissFocus on the latest microscopy techniques and a wide range of applications. This year, ZEISS hosted the Day of Microscopy at the ZEISS Forum and ZEISS Microscopy Customer Center Europe in Oberkochen, Germany on May 16 and 17. International guests from research, science, and industry benefited from a varied program of lectures, workshops and discussions that gave insights...

 

  ZEISS Presents new Enhanced Software Technology

ZEISS ZEN Connect offers intuitive data management, simplified sample workflows, and unlimited navigationZEISS introduces new software modules with enhanced imaging technology: ZEISS ZEN Connect is especially useful for, but not limited to, structural analysis, examination of cellular processes, localization of cells, and much more. The proven ZEISS ZEN software combines numerous functions for day-to-day work with microscopes and stands for scientific success.....

 

  ZEISS Expands X-Ray Imaging Portfolio with ZEISS Xradia Context microCT

Xradia ContextZEISS introduces a new X-ray imaging instrument, ZEISS Xradia Context microCT, a large field-of-view, non-destructive 3D X-ray microcomputed tomography system. ZEISS Xradia Context is built on time-tested ZEISS Xradia technology, reaping crossover...

 

  ZEISS Announces Advances in Tomographic Imaging with Results 4x Faster

mining sampleZEISS introduces a new module for the ZEISS Xradia Versa 500-series of 3D X-ray microscopes (XRM) that will allow users to acquire high quality images in one-quarter the time. ZEISS OptiRecon enables users to make the optimal choice for their requirements: same quality images four times faster, or superior quality in the same amount of time as standard image acquisition using an advanced new...

 

  Tobias Kippenberg and Jean-Pierre Wolf to Receive ZEISS Research Award

tobias-kippenbergProf. Tobias J. Kippenberg and Prof. Jean-Pierre Wolf are the 2018 winners of the prestigious ZEISS Research Award. The jury was impressed by their exceptional work. Tobias Kippenberg, Professor at the Laboratory of Photonics and Quantum Measurements at the École Polytechnique Fédérale de Lausanne (EPFL), is a pioneer in the field of cavity optomechanics and microresonator-based optical frequency combs....

 

  New Focal Charge Compensation mode for ZEISS field emission scanning electron microscopes improves image quality

rat spinalIn collaboration with the National Center for Microscopy and Imaging Research (NCMIR) at the University of California San Diego, ZEISS releases a new Focal Charge Compensation module for block face imaging with ZEISS GeminiSEM and 3View® from Gatan, Inc. Focal Charge Compensation expands versatility and considerably increases data quality without prolonging acquisition times and enables easy imaging of even the most charge-prone samples....

 

  New Generation of ZEISS EVO Scanning Electron Microscope Introduced

Modular platform for intuitive operation, routine investigations and research applications. ZEISS presents the new generation of its proven high-performance scanning electron microscope (SEM): The new instruments of the ZEISS EVO family come with a variety of improvements regarding usability, image quality and seamless integration into multimodal workflows. With its comprehensive range of available options, the ZEISS EVO family can be tailored precisely to requirements in life sciences, material sciences, or routine industrial quality assurance.....

 

  ZEISS Acquires Majority Stake in Italian X-ray Provider BOSELLO HIGH TECHNOLOGY

zeiss-majority-stake-on-boselloZEISS and BOSELLO HIGH TECHNOLOGY have announced that the ZEISS Group will acquire a majority stake in the provider of industrial X-ray solutions.

For ZEISS, BOSELLO’s tailor-made solutions are a further step in the process of evolving into a one-stop provider of non-destructive measuring and inspection technology. The shared goal is to strengthen inline computed tomography....

 

  ZEISS Introduces Machine Learning Capability for Microscopy

Low contrast mining mineralogy grainsFirst ZEISS ZEN Intellesis solution enables segmentation of correlative microscopy datasets

 ZEISS announces ZEISS ZEN Intellesis, a new machine learning capability that enables researchers to perform advanced analysis of their imaging samples across multiple microscopy methods. The first algorithmic solution introduced by the ZEISS ZEN Intellesis platform makes...

 

  New Field Emission Scanning Electron Microscope ZEISS GeminiSEM 450 Introduced

Inlens SE detector

Addressing the highest demands in imaging and analytics from any sample, ZEISS introduces its new field emission scanning electron microscope (FE-SEM) ZEISS GeminiSEM 450. The instrument combines ultrahigh resolution imaging with the capability to perform advanced analytics while maintaining flexibility and ease-of-use. 

 

  New Focal Charge Compensation Mode for ZEISS Field Emission Scanning Electron Microscopes Improves Image Quality

scanning electronHigh resolution 3D block face imaging for biological samples with fast acquisition rates and minimal sample damage

In collaboration with the National Center for Microscopy and Imaging Research (NCMIR) at the University of California San Diego, ZEISS releases a new Focal Charge Compensation module for block face imaging with ZEISS GeminiSEM and 3View® from Gatan, Inc....

 

  New 2D Superresolution Mode for ZEISS Airyscan Delivers 120 Nanometer Lateral Resolution

Airyscan Improved optical sectioning delivers higher resolution without the need to acquire a z-stack

At Neuroscience 2017, a new imaging mode for the ZEISS LSM 8 family with Airyscan has been introduced. Their unique 32-channel GaAsP array detector captures more spatial information than traditional confocal microscopes....

 

  ZEISS introduces newest release of LabDCT Diffraction Contrast Tomography Platform for Analytical 3D Materials Imaging

Non-destructive LabDCT 3D grain structure of ironAdvanced analytical module for tomography in the laboratory provides 3D grain imaging

ZEISS is extending the boundaries of non-destructive 3D X-ray imaging with the newest release of its diffraction contrast tomography platform, LabDCT. LabDCT provides large volume 3D maps of grains, the fundamental building blocks of metal alloys and other polycrystalline materials....

 

  ZEISS Crossbeam 550 Receives German Design Award 2018

crossbeamA jury of experts from the German Design Council has voted the ZEISS Crossbeam 550 focused ion beam scanning electron microscope (FIB-SEM) as a winner of the German Design Award 2018 in the "Material and Surfaces" category.

Users of this FIB-SEM investigate nanostructures such as composites, metals, biomaterials or semiconductors with analytical and imaging methods in parallel. ZEISS Crossbeam 550 allows simultaneous modification and monitoring of samples, resulting in fast sample preparation and high throughput....

 

  New Generation of ZEISS EVO Scanning Electron Microscope Introduced

ZEISS presents the new generation of its proven high performance scanning electron microscope (SEM):

EVOThe new instruments of the ZEISS EVO family come with a variety of improvements regarding usability, image quality and seamless integration into multimodal workflows. With its comprehensive range of available options, the ZEISS EVO family can be tailored precisely to requirements in life sciences, material sciences....

 

  ZEISS Signed Strategic Partnership Agreement with Xnovo

Exclusive laboratory-based X-ray microscopy solution for materials science

ZeissThe ZEISS Microscopy business group announced today that it has signed an exclusive strategic partnership agreement with Denmark-based Xnovo Technology ApS, a company that develops innovative software-based 3D X-ray imaging and analysis solutions....

 

  ZEISS Invests Over EUR 300 Million in Jena High-Tech Site

ZEISS will invest over €300 million in a new integrated high-tech site. The world’s technology leader in the optics and optoelectronics industries unveiled its plan today in Jena. 

zeissIn line with this plan, ZEISS will bring together its existing sites in Jena by 2023. To do this, ZEISS will acquire partially unused premises from SCHOTT, which it will renovate and use to construct a new facility for its second-largest site worldwide. Jena is thus an integral part of ZEISS’s global investment strategy....

 

  ZEISS Invests €30 Million in Innovation Hub at KIT

ZEISS plans to build a new shared innovation hub on the north campus of the Karlsruhe Institute of Technology (KIT).

zeiss innovation hubConstruction is scheduled to begin in early 2018; the €30 million hub will cover 12,000 square meters. With the ZEISS Innovation Hub, the global technology leader in optics and optoelectronics is making a sustainable investment in Germany as a place for innovation.....

 

  ZEISS Presents New Microscope Cameras

New ZEISS Axiocam Models Complement Camera Portfolio

axiocamZEISS introduces two new digital microscope cameras; ZEISS Axiocam 702 mono and ZEISS Axiocam 512 color complement the current portfolio of high-speed USB 3.0 microscope cameras. With ZEISS Axiocam 702 mono ZEISS for the first time introduces a microscope camera with a scientific CMOS sensor...

 

  ZEISS presents a networked quality laboratory

Lab infrastructure solution ZEISS ZEN 2 core is connecting systems, data and workflows

zeiss labZEISS presents a networked lab for quality control and quality assurance. Connected systems, data and workflows enable more efficient collaboration - even across lab boundaries....

 

  ZEISS Opens New Microscopy Customer Center

Experience correlative and advanced 3D microscopy

zeiss openingOn 24 April 2017 ZEISS opened the new ZEISS Microscopy Customer Center Europe at the Oberkochen site. This is the most comprehensive ZEISS Customer Center including light, electron and X-ray microscopy in a single location...

 

  New Imaging Software ZEISS ZEN 2 Core

Lab infrastructure solution ZEISS ZEN 2 core is connecting systems, data and workflows

ZEISS ZEN 2 coreWith the new release of the imaging software ZEISS ZEN 2 core, users in laboratories are now even more efficient. ZEISS ZEN 2 core is not only used as a powerful tool for image analysis and interactive control of microscopes....

 

  ZEISS Crossbeam 550 sets new standards in 3D analytics and sample preparation with FIB-SEMs

Enhanced resolution and faster FIB material processing for maximum efficiency

Crossbeam 550ZEISS presents a new generation of focused ion beam scanning electron microscopes (FIB-SEMs) for high-end applications in research and industry. ZEISS Crossbeam 550 features a significant increase in resolution for imaging and material characterization and a speed gain in sample preparation....

 

  New ZEISS Celldiscoverer 7 for Live Cell Imaging

Automated Microscopy Platform Offers High Flexibility and Throughput

ZEISS introduces a new system for automated microscopy in life sciences research. ZEISS Celldiscoverer 7 combines the user-friendly automation features of a boxed microscope with the image quality and flexibility of a classic inverted research microscope. Scientists acquire better data in shorter times with 2D or 3D cell cultures, tissue sections or small model organisms.

 

  New ZEISS Axio Observer Microscopes for Life Sciences

The open and flexible inverted microscope platform for living and fixed specimens

ZEISS introduces a new inverted microscope platform for life science research. The ZEISS Axio Observer family consists of three stable and modular microscope stands for flexible and efficient imaging. Scientists benefit from reproducible results from their experiments and high quality image data from a whole range of samples in a variety of conditions....

 

  ZEISS Atlas 5 – a new approach to master the multi-scale challenge

ZEISS introduces an integrated solution to acquire and analyze multi-scale and multi-modal images in light, electron and X-ray microscopy

ZEISS Atlas 5ZEISS Atlas 5 is a powerful hardware and software package that extends the capacity of ZEISS scanning electron microscopes (SEM) and focused ion beam SEMs (FIB-SEM). ZEISS Atlas 5 streamlines automatic image acquisition and lets users benefit from its efficient navigation and correlation of images from any source including light and X-ray microscopes. 

 

  ZEISS Increases the Speed of the World’s Fastest Scanning Electron Microscope

Introducing ZEISS MultiSEM 506 acquiring more than 2 Tera pixel per hour

ZEISS has announced a new variant of the world’s fastest scanning electron microscope: ZEISS MultiSEM 506 features 91 beams working in parallel and increases the throughput of the ZEISS MultiSEM 505 by a factor of three. The unrivaled net acquisition speed of more than 2 Tera pixel per hour enables large-scaled experiments such as imaging of cubic millimeters of brain tissue at nanometer resolution for the analysis of neural circuits.

 

  ZEISS Presents New Correlative Workflows for M&M 2014

FIB-SEM, X-Ray and Correlative Workflows Showcased at M&M 2014

/zeiss image 2ZEISS Microscopy announces that it will be demonstrating its new ZEISS Crossbeam Focused Ion Beam Scanning Electron Microscope (FIB-SEM) at M&M 2014, August 3-7 at the Connecticut Convention Center in Hartford, CT.  ZEISS Crossbeam FIB-SEM increases throughput using a high beam current of up to 100 nA. While milling samples at unprecedented precision at all currents, users acquire images and analytical data in up to...

 

  R&D 100 Award 2014 for ZEISS ELYRA P.1 with 3D-PALM

ZEISS is receiving Research & Development award once more

zeiss logoZEISS ELYRA P.1 with 3D-PALM has been selected by the expert judges and editors of R&D Magazine as a recipient of a 2014 R&D 100 Award. The patented exclusive PALM technology of ZEISS ELYRA P.1 is regarded as one of 100 most significant high-technology products introduced in the past year. As its name suggests, the 3D-PALM module enables superresolution photoactivated localization microscopy (PALM) in 3D. With ELYRA P.1 and 3D-PALM, researchers can...

 

  Intelligent Tool for Optical Inspection

Market launch of ZEISS Smartzoom 5

ZEISS smartroomAt the trade show for quality assurance Control from May 6–9, 2014, the Microscopy business group of ZEISS presented its first automated digital microscope. The device particularly stands out thanks to its one-of-a-kind operating concept, which makes operation as easy as possible for the user. In an industrial environment, optical inspection is an important part of production-related quality testing. Parts such as screws, printed circuit boards, and metal elements need to be examined for defects...