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Discover the New ZEISS AI Sample Finder

publication date: Oct 29, 2020
author/source: ZEISS


Reduce your time to experiment from minutes to seconds

Microscopes are becoming increasingly automated. However, sample placement, focus adjustment, and identification of the relevant sample areas still require manual adjustments.

The new ZEISS AI Sample Finder automates this sequence entirely:

  • Placement of sample
  • Acquisition of an overview image
  • Identification of the sample carrier
  • Detection of relevant sample areas
  • Focus adjustment for each region of interest

After just seconds, you can access all sample areas directly and start your experiment right away.


See here how it works:



Discover ZEISS AI Sample Finder


AI Sample Finder is part of the microscope platform ZEISS Axio Observer. For more information on upgrading your existing Axio Observer, get in contact with us over the AI Sample Finder website.


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