Channels

 

Special Offers & Promotions

 

 

Latest News

 

 

View Channel

New Products

 

 

View Channel

Video Presentations

 

 

View Channel

Separation Science

 

 

View Channel

Microscopy & Image Analysis

 

 

View Channel

Laboratory Automation & IT Solutions

 

 

View Channel

 

New Field Emission Scanning Electron Microscope ZEISS GeminiSEM 450 Introduced

publication date: Dec 22, 2017
 | 
author/source: ZEISS

Inlens SE detectorAddressing the highest demands in imaging and analytics from any sample

ZEISS introduces its new field emission scanning electron microscope (FE-SEM) ZEISS GeminiSEM 450. The instrument combines ultrahigh resolution imaging with the capability to perform advanced analytics while maintaining flexibility and ease-of-use. 

With ZEISS GeminiSEM 450, users benefit from high resolution, surface sensitive imaging and an optical system that ideally supports them in obtaining the best analytical results – especially when working with low voltages. High-throughput electron backscatter diffraction (EBSD) analysis and low voltage X-ray spectroscopy (EDS) deliver excellent results due to ZEISS Gemini 450’s ability to precisely and independently control spot size and beam current. With the Gemini 2 design, it is possible to always work under optimized conditions as the user can switch seamlessly between imaging and analytical modes at the touch of a button. This makes ZEISS GeminiSEM 450 the ideal platform for the highest demands in imaging and analytical performance.

In addition, ZEISS GeminiSEM 450 has been designed to cater for a broad variety of sample types from classical conductive metals to beam sensitive polymers. In particular the variable pressure technology of ZEISS GeminiSEM 450 reduces charging on non-conductive samples without compromising Inlens detection capabilities and at the same time enables high resolution EDS analysis by minimizing the skirt effect. Based on this design, ZEISS GeminiSEM 450 provides a flexible instrument suited to a broad variety of applications in materials science, industrial labs and life sciences.

“With ZEISS GeminiSEM 450 we have introduced a new FE-SEM flagship for highest performance analytics and ultrahigh resolution. In addition to this product launch, we are also rolling out significant enhancements to both the ZEISS GeminiSEM and ZEISS Sigma families. As an example, the ZEISS Sigma family now benefits from the introduction of the high resolution gun mode that has previously only been available on the ZEISS Gemini series” says Dr. Michael Albiez, head of electron microscopy at ZEISS.


more about zeiss


more news from zeiss


 

 

 


If you have not logged into the website then please enter your details below.



 

Subscribe to any of our newsletters for the latest on new laboratory products, industry news, case studies and much more!

Newsletters from Lab Bulletin

 

Request your free copies HERE

 

 

 

Popular this Month

Top 10 most popular articles this month

 

 

Today's Picks

 


 

Looking for a Supplier?

Search by company or by product

 


Company Name:

Product:


 

 

 

 

Please note Lab Bulletin does not sell, supply any of the products featured on this website. If you have an enquiry, please use the contact form below the article or company profile and we will send your request to the supplier so that they can contact you directly.

Lab Bulletin is published by newleaf marketing communications ltd.


 

Media Partners

 

Exhibitions & Events