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ZEISS Announces Advances in Tomographic Imaging with Results 4x Faster

publication date: Apr 25, 2018
 | 
author/source: ZEISS

mining sample


Iterative reconstruction with ZEISS OptiRecon

ZEISS introduces a new module for the ZEISS Xradia Versa 500-series of 3D X-ray microscopes (XRM) that will allow users to acquire high quality images in one-quarter the time. ZEISS OptiRecon enables users to make the optimal choice for their requirements: same quality images four times faster, or superior quality in the same amount of time as standard image acquisition using an advanced new iterative reconstruction technique.

ZEISS OptiRecon is faster, more efficient and user-friendly than standard iterative reconstruction processes that are much more computationally intensive and require extensive user expertise. A combination of a workflow-based user interface that doesn’t require programming knowledge and an efficient proprietary implementation that allows reconstruction of a typical dataset deliver results in about three minutes. This technology opens the door to 3D X-ray imaging, or computed tomography, to both a wider range of industrial applications and the examination of in situ processes occurring at previously inaccessible timescales. 

ZEISS OptiRecon has been demonstrated to be especially effective for geological or other “sparse” samples where features are large relative to voxel size. Dr. Branko Bijeljic, Senior Research Fellow, Department of Earth Science & Engineering at Imperial College London, was an early tester of the system. He says, “Iterative reconstruction is a key new technology for improving our work in high resolution X-ray microscopy. It will allow us to address in situ processes occurring at considerably shorter time scales without sacrificing image quality or data segmentability.” Dr. Bijeljic co-authored a paper on the topic that is now available from the Journal of Advances Water Resources: Optimisation of image quality and acquisition time for lab-based X-ray microtomography using an iterative reconstruction algorithm.

Lourens Steger, head of X-ray microscopy at ZEISS USA, commented, “ZEISS OptiRecon exemplifies our commitment to leading the industry by bringing new advanced imaging capabilities to our award-winning X-ray microscopes. Since 2010, the ZEISS Xradia Versa family has consistently demonstrated unique capabilities for its users in electronics, materials, life sciences, and the oil and gas industry. As this latest release shows, we continue to develop based on our customers’ needs, in this case for the geological sciences in academia and industry, including oil and gas, and mining. We continue to progress this system with both hardware and software advancements to meet and exceed our users’ needs.”

ZEISS OptiRecon is a combined hardware/software module, built on an advanced workstation. It is available to existing users as a field upgrade, or can be purchased as an additional capability for ZEISS Xradia 510/520 Versa 3D X-ray microscopes


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