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Hitachi High-Technologies Launches Two New Scanning Electron Microscopes

publication date: May 9, 2019
 | 
author/source: Hitachi High-Technologies

Hitachi-Launches-Two-New-Scanning-Electron-Microscopes


Hitachi High-Technologies is set to launch two new scanning electron microscopes (SEMs), which will be unveiled at the 33rd Control in Stuttgart, Germany, between the 7th and 10th May.

The SU3800 and oversized SU3900 SEMs feature the ability to accommodate large, heavy specimens, along with advanced functionalities for automated measurement and wide-angle camera navigation.

SEMs perform a diverse array of structural observations and compositional analyses in a wide variety of fields, including nanotechnology and biotechnology.

Dr Robert Steffen, European product manager at Hitachi High-Technologies Europe, said: “SEM applications are expanding more rapidly than ever, requiring analysis of greater size and weight specimens, such as materials from mining or automotive-related industries. However, specimens of this nature push stage limits beyond previous capacity, making it necessary to cut or further process before imaging – this restriction has given rise to demand for the ability to observe samples without reducing the size.

“Furthermore, SEMs are increasingly a key component for quality assurance and production control, in addition to their conventional applications in research and development. As a result, modern SEMs must be highly versatile and easy to use for all experience levels.”

To address these needs and more, Hitachi High-Technologies has introduced a novel solution with the SU3800/SU3900. Advanced automation functions, including auto-start, wide-angle camera navigation with stitching and auto-algorithms, enable a high-throughput, easy-to-use system for both new and experienced operators.

The oversized SU3900 features a class-leading specimen chamber/stage configuration with ability to accommodate a 300mm sample diameter and loading capacity of up to 5kg. This allows for easy observation of very large samples without the need to cut or process prior to imaging.

Robert added: “The development of the SU3800/SU3900 marks another key step in the development of Hitachi High-Technologies’ SEMs, and their applications within the field of microscopy.

“The improvements in the specimen chamber size means that there is no longer the need to cut or further process a sample before imaging, which in turn provides a truer, more accurate image of the sample. As a result, users can cut down processing time and improve efficiencies within their business.

“At Hitachi High-Technologies, our aim is to offer customers products that meets their ever-evolving requirements. Therefore, we will continue to promote development, as well as sales expansion of highly sophisticated solutions and technologies, by responding swiftly to the needs of customers and markets.”

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