Channels

 

Special Offers & Promotions

 

 

Latest News

 

 

View Channel

New Products

 

 

View Channel

Video Presentations

 

 

View Channel

Separation Science

 

 

View Channel

Microscopy & Image Analysis

 

 

View Channel

Laboratory Automation & IT Solutions

 

 

View Channel

 

Agar provides improved standards for AFM with Geller NIST and NPL-traceable calibration samples

Agar Scientific, a leading supplier of microscopy accessories and consumables, provides NIST and NPL traceable Certified Reference Materials from Geller Microanalytical Laboratory.

NIST NPL traceable Certified Reference Standards for AFMAs a leading supplier of accessories for microscopy, Agar Scientific has long been known for the quality of its wide range of calibration standards for Electron Microscopy. For AFM users, the Geller reference standards MRS-3, 4 and 5 are a series of high quality standards that are NIST/NPL traceable. They allow the accurate calibration of scanning probe instruments such as STM and AFM. The magnification range is from ~10X to 1,000,000X. The copyrighted pattern consists of a series of nested squares with pitches of 0.08, 0.1, 0.5, 1, 2, 50, and 500 µm with a pattern height that is a NIST traceable 0.1 µm. Squares are used such that magnification can be calibrated in two directions. The MRS-5 has pitch patterns from 2 µm to 80 nm with an uncertainty less than 3 nm.

These Certified Reference Materials are generated using the magnification calibration procedures for optical, video and scanning microscopies as described in ASTM method E766-88. The example shown here is an AFM image from the NPL taken with a sharpened tip and illustrates an 80 nm pitch pattern. The individual lines have variable heights. Traceable measurements are provided for the 2, 1 and 0.1 µm pitch patterns. Full details are supplied on the accompanying measurement certificates. These standards provide particularly fine pitch patterns. The 80 nm pitch has a nominal space width of 40 nm. Users of such standards must be aware that the cantilever tip must be smaller to define the pattern.

For routine use, Agar Scientific also offers a range of consumables for AFM studies. Specimen discs in varying sizes and assorted materials provide consistently flat surfaces for easy mounting of AFM specimens. Magnetic stainless steel, mica and glass are available. Combined with custom gripper's and pickup tools, the specimen discs can be readily demounted after use and placed in specifically designed boxes for dust free storage.

To learn more about calibration standards for SPM users, contact Agar Scientific. Agar Scientific also provides a comprehensive catalogue and price list on all accessories and consumables for microscopy. To receive your free copy, please visit www.agarscientific.com and register today.

more news from Agar Scientific


 


If you have not logged into the website then please enter your details below.



 

News Channels

 

 

Subscribe to any of our newsletters for the latest on new laboratory products, industry news, case studies and much more!

Newsletters from Lab Bulletin

 

Request your free copies HERE

 

 

 

Popular this Month

Top 10 most popular articles this month

 

 

Today's Picks

 

 

 

 

Looking for a Supplier?

Search by company or by product

 


Company Name:

Product:


 

 

 

 

Please note Lab Bulletin does not sell, supply any of the products featured on this website. If you have an enquiry, please use the contact form below the article or company profile and we will send your request to the supplier so that they can contact you directly.

Lab Bulletin is published by newleaf marketing communications ltd.


 

Media Partners

 

Exhibitions & Events