Special Offers & Promotions



Latest News



View Channel

New Products



View Channel

Video Presentations



View Channel

Separation Science



View Channel

Microscopy & Image Analysis



View Channel

Laboratory Automation & IT Solutions



View Channel


NIST research highlights promise of AFM-IR for quantitative nanoscale chemical analysis

Anasys Instruments announces a new paper authored by Dr Andrea Centrone and his colleagues at NIST published recently in Small, a leading publication which focuses on the nano and micro worlds

Schematic to show the operation of AFM-IRDr Centrone's team reported on experiments that carefully studied the AFM-IR signal strength versus sample thickness. The experiments showed that the AFM-IR signal increases linearly with thickness for samples up to 1µm thick. This observed linearity may pave the way for quantitative chemical analysis at the nanoscale.

AFM-IR has recently attracted great interest in that it enables chemical identification and imaging with nanoscale resolution. In this paper, NIST reports on electron beam nanopatterned polymer samples which were fabricated directly on zinc selenide prisms and used to experimentally evaluate the AFM-IR signal lateral resolution, sensitivity and linearity. The authors have shown that the AFM-IR lateral resolution for chemical imaging is comparable to the lateral resolution obtained in the AFM topography. Spectra and chemical maps were produced from samples as thin as 40 nm. The observations also provide experimental confirmation of theoretical predictions on AFM-IR previously developed by Prof Alexandre Dazzi of Univ of Paris-Orsay who is also the inventor of the technique.

The patented AFM-IR technique is available commercially as the nanoIR™ platform from Anasys Instruments, Santa Barbara, CA. In AFM-IR, a rapidly pulsed infrared (IR) laser is directed on upon a thin sample which absorbs the IR light and undergoes rapid thermomechanical expansion. An AFM tip in contact with the sample resonates in response to the expansion, and this resonance is measured by the AFM. "We are excited by this through work by Dr. Centrone and his colleagues," said Craig Prater, Chief Technology Officer of Anasys Instruments. "We applaud NIST's research and involvement in advancing nanoscale characterization of materials using AFM-based spectroscopy."

For information about the AFM-IR products from Anasys Instruments, please visit

To view the new paper click here

If you have not logged into the website then please enter your details below.


Subscribe to any of our newsletters for the latest on new laboratory products, industry news, case studies and much more!

Newsletters from Lab Bulletin


Request your free copies HERE




Popular this Month

Top 10 most popular articles this month



Today's Picks



Looking for a Supplier?

Search by company or by product


Company Name:






Please note Lab Bulletin does not sell, supply any of the products featured on this website. If you have an enquiry, please use the contact form below the article or company profile and we will send your request to the supplier so that they can contact you directly.

Lab Bulletin is published by newleaf marketing communications ltd.


Media Partners


Exhibitions & Events