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Say ‘hello’ to the new Aeris XRD at our digital event

publication date: Feb 19, 2021
 | 
author/source: Malvern Panalytical Ltd

say-hello-the-new-aeris-xrd-our-digital-event

 

Powering the next generation of XRD research

Malvern Panalytical, a leading analytical instrument supplier, will launch a new version of Aeris compact X-ray diffractometer (XRD) at a digital event on February 23, 2021 at 2.00 PM CET. This next generation of XRD instruments will give the user additional methods for analyses traditionally only available in multipurpose floor-standing systems. The event will feature several engaging presentations from Malvern Panalytical’s panel of experts, as well as a live demo of the new Aeris.

Building on the family of Aeris XRD systems that are compact and provide high quality data from polycrystalline materials at competitive speeds, the new Aeris model is designed for use in all environments. Specifically, grazing-incidence XRD (GIXRD) will enable the examination of thin films and coatings, while transmission measurements will provide more accurate data that are not affected by sample preparation artefacts.

 

Join us for an engaging event

To introduce the new model, talk about its innovative features, and demonstrate how a compact instrument can compare to floor standing XRD analysis instruments, Malvern Panalytical is hosting an online event on February 23, 2021, from 2pm to 3pm CET. There is no charge for this event. Our experts will explain how the new Aeris model will power the next generation of XRD research and will set a new standard for ease of use and data quality.

 

The agenda is as follows:

  • Welcome – Meet our experts Willijan Vissers, Fabio Masiello and Nicholas Norberg
  • XRD – Evolving over the years
  • Powering the next generation for XRD research
  • Live demonstration of the new Aeris
  • Closing and FAQ

 

 

Learn more | Register for event

 


 


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