All essential light microscopy contrasting methods and high precision 3D topography in a single instrument

ZEISS introduces the confocal laser scanning microscope ZEISS LSM 800 for materials applications and analysis in research and industry. ZEISS LSM 800 enables precise, three-dimensional imaging of microstructures and surfaces. The combination of confocal fluorescence and other contrasting techniques in one instrument enables high-precision examination of nanomaterials, metals, polymers, and semiconductors with maximum information content. The system offers precise capture of 3D topography and the investigation of nanometer-scaled structures without causing surface damage.

The combination of ZEISS LSM 800 laser scanning module with ZEISS Axio Imager, the leading inverted microscope platform for materials research, enables a wide variety of configurations in hardware, for example objectives, stages and illumination. Users save time on set-up and sample handling thanks to the availability of various optical techniques such as brightfield, darkfield, polarization and the ZEISS unique Circular Differential Interference Contrast (C-DIC).

ZEISS LSM 800 for materials comes with the newest version of ZEN imaging software, which includes an open application development (OAD) interface for data exchange with established third-party analysis and research software. The combination of ZEISS optics and software guarantees the highest reproducibility of measurements and provides a guided acquisition workflow to make operation easier and enable standardized acquisition parameters. Dedicated developments for demanding material applications such as optimized scanner speed, topography analysis, and layer thickness measurement make ZEISS LSM 800 an excellent choice for scientists and engineers in research and industrial labs.

A webinar taking place on May 19, 2016, will give information on the benefits of ZEISS LSM 800 for material-focused applications. Registration is open at: http://bit.ly/lsm800-mat 

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