ZEISS Microscopy announces that it will be demonstrating its new ZEISS Crossbeam Focused Ion Beam Scanning Electron Microscope (FIB-SEM) at M&M 2014, August 3-7 at the Connecticut Convention Center in Hartford, CT. ZEISS Crossbeam FIB-SEM increases throughput using a high beam current of up to 100 nA. While milling samples at unprecedented precision at all currents, users acquire images and analytical data in up to...