Organisers of the two-day Particle Summit, which takes place near Boston in October (October 20-21, 2010; The Charles Hotel, Cambridge MA), have announced two further speakers for the event, adding to an already packed program:  

Dr Joerg Bolze from analytical X-ray company PANalytical will discuss ‘Nanoparticle size distribution determination by small-angle X-ray scattering on a multi-purpose X-ray diffractometer platform'. He will include a short introduction to the SAXS technique together with application examples illustrating its potential and limitations for liquid nanoparticle dispersions, nano-powders, and nanocomposites.

Alon Vaisman from Malvern Instruments will present ‘Particle sizing - a proven technology for process control' in which he will describe how implementing on-line laser diffraction and real-time process control can maximize efficiency and eliminate out-of-spec production.

These additions to the program bring the number of speakers over the two days to seventeen, who between them will cover a wide range of particle characterization topics and technologies.  

The event, which is sponsored by Malvern Instruments, also features an optional pre-conference workshop on October 19 where participants can learn or refresh their knowledge of the basic principles of particle characterization.  

For a full program and registration information visit www.particlesummit.org  where you can also connect on Twitter, Linked In and via the blog.