Recent advancements in large-area scanning for high-speed atomic force microscopy (AFM)

Queensgate and the United Kingdom's National Metrology Institute have revealed their latest breakthrough at Euspen’s Special Interest Conference: Precision Motion Systems and Control in November.

The development is a novel control system for a two-axis flexure stage with a 100 µm x 100 µm scanning range that enables high-speed atomic force microscopy (HS-AFM) over large areas. The result is an HS-AFM system capable of imaging large areas with molecular-level resolution.

This development was enabled following the fourth project that Queensgate and NPL have collaborated on as part of Innovate UK’s Analysis for Innovation (A4I) program. The aim is to qualify the implementation of arbitrary 2D scan paths using either contoured or position-velocity-time (PVT) motion trajectories.

Previous collaborations have already pushed the boundaries of what is possible in the field of nanopositioning, such as improved velocity control and multi-axis correction, all of which produce tangible benefits for users or developers of nanopositioning systems.

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