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Carl Zeiss has received two orders for the extreme ultraviolet lithography system AIMS EUV
GLOBALFOUNDRIES, Intel, Samsung
Electronics, and TSMC are the members of the SEMATECH EMI Partnership.
According to the slot assignment two out of the four semiconductor companies have
placed orders with Carl Zeiss Semiconductor Metrology Systems (SMS) Division.
Carl Zeiss SMS develops the AIMSTM EUV tool in cooperation with the scanner
optics department of Carl Zeiss SMT, Lithography Optics (LIT), and external
partners.
"The orders represent an important milestone in the development of AIMSTM EUV and confirm the relevance of EUV technology for the industry. We expect the remaining two EMI members to place their orders in accordance with their slot assignments agreed upon at the start of the EMI consortium." said Dr. Oliver Kienzle, Managing Director of Carl Zeiss SMS. The AIMSTM EUV platform represents a critical tool for the development and manufacturing of defect-free EUVL masks supporting the 22 nm half-pitch (HP) technology node requirements with extendibility to the 16 nm HP node. A first production-worthy version of the platform is scheduled for delivery in the third quarter of 2014.
SEMATECH launched EMI in 2010 to fill a key infrastructure gap for EUV in the area of mask manufacturing, by funding development of critical metrology tools. EMI is administered by SEMATECH's Lithography Program, based at the College of Nanoscale Science and Engineering (CNSE) of the University at Albany.
To initiate EMI's first major project, SEMATECH and Carl Zeiss have signed a collaboration agreement for the development and manufacturing of the industry's first-ever actinic aerial image metrology EUV system targeted for EUVL volume production.
For further information visit
"The orders represent an important milestone in the development of AIMSTM EUV and confirm the relevance of EUV technology for the industry. We expect the remaining two EMI members to place their orders in accordance with their slot assignments agreed upon at the start of the EMI consortium." said Dr. Oliver Kienzle, Managing Director of Carl Zeiss SMS. The AIMSTM EUV platform represents a critical tool for the development and manufacturing of defect-free EUVL masks supporting the 22 nm half-pitch (HP) technology node requirements with extendibility to the 16 nm HP node. A first production-worthy version of the platform is scheduled for delivery in the third quarter of 2014.
SEMATECH launched EMI in 2010 to fill a key infrastructure gap for EUV in the area of mask manufacturing, by funding development of critical metrology tools. EMI is administered by SEMATECH's Lithography Program, based at the College of Nanoscale Science and Engineering (CNSE) of the University at Albany.
To initiate EMI's first major project, SEMATECH and Carl Zeiss have signed a collaboration agreement for the development and manufacturing of the industry's first-ever actinic aerial image metrology EUV system targeted for EUVL volume production.
For further information visit
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