Follow us...

 

Search News Archives

News Channels

 

New Laboratory Products

Lab News

What's going on at Lab Innovations

Research & Case Studies

Microscopy | Image Analysis

Separation Science

Brochures & Literature

Videos

Events | Webinars

 

 

Conferences | Events

WITec introduces “True Surface Microscopy”

Topographic Confocal Raman Imaging -The next evolutionary leap in cutting-edge microscope configurationsWITec, worldwide leader in nano-analytical microscopy systems, has launched the new True Surface Microscopy option. The core element of this revolutionary imaging mode is an integrated sensor for optical profilometry. Large-area topographic coordinates from the profilometer measurement can be precisely correlated with the large-area confocal Raman imaging data. This allows for the first time confocal Raman imaging along heavily inclined or very rough samples with the true surface held in constant focus while maintaining the highest confocality. With the new imaging mode, samples that had previously required extensive preparation in order to obtain a certain surface flatness can now be effortlessly and automatically characterized as they are. Complete system control as well as extensive data evaluation are integrated within the WITec Control and WITec Project software environment, guaranteeing renowned ease-of-use.

"The integrated combination of optical profilometry and large-area confocal Raman imaging is the next evolutionary leap in cutting-edge microscope configurations." says Dr. Olaf Hollricher, WITec managing director R&D. "Only an inherently modular instrument design can enable such a seamless incorporation of a groundbreaking and complementary imaging technique into the present product line of Raman-AFM systems."

The profilometry capabilities of True Surface Imaging mode allows scan ranges of up to 50x100 mm with a spatial resolution on the order of 100 nm vertically and 10 µm laterally. Measuring distances of 10 mm and more provide flexibility for variable sample size requirements. In combination with AFM, the profilometer can even be used as a pre-inspection tool to determine topographic features of interest for high-resolution AFM investigations on large samples. The overall performance and exceptionally accurate imaging capabilities of True Surface Microscopy are beneficial for many applications, including the characterization of micromechanical, medical, or semiconductor devices, the mapping of functionalized surfaces, or the imaging of bio-medical or pharmaceutical material surface properties. 

For more information, please visit www.witec.de.

About WITec

WITec is a manufacturer of high performance optical and scanning probe microscopy systems. A modular product line allows the combination of different microscopy techniques such as Raman, SNOM or AFM in a single instrument for flexible analysis of the optical, chemical and structural properties of a sample. The instruments are distributed worldwide and are used primarily in the fields of Materials Science, Life Science and Nanotechnology. WITec is based in Ulm, Germany with regional headquarters in Maryville, TN, USA and Singapore.


If you have not logged into the website then please enter your details below.



 

 

Popular this Month...

Our Top 10 most popular articles this month

 

Today's Picks...

 

 


 

Looking for a Supplier?

Search by company or by product

 


Company Name:

Product:


 

 

Please note Lab Bulletin does not sell, supply any of the products featured on this website. If you have an enquiry, please use the contact form below the article or company profile and we will send your request to the supplier so that they can contact you directly.

Lab Bulletin is published by newleaf marketing communications ltd

 


Promotions

 

Media Partners