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Challenge Testing Focus for Whitehouse Scientific at FILTECH 2015

publication date: Feb 11, 2015
author/source: Whitehouse Scientific Ltd

Dr Graham Rideal, CEO of Whitehouse Scientific, will present a keynote lecture at FILTECH 2015 on the topic of ‘Measuring Filter Cut Points and Pore Size Distributions by Challenge Testing’.

 Dr Graham RidealThe conference takes place from 24-26 February in Cologne, Germany, where Whitehouse Scientific is also an exhibitor, and Dr Rideal’s lecture is on Wednesday 25 February at 9.00 am.

Challenge testing is a direct or primary method for measuring pore size in filters, which involves collecting and measuring the challenging particles that pass through the filter. It has advantages over secondary methods, such as porometry, which rely on theoretical predictions to calculate pore size and are not traceable to international standards. However, delivering unambiguous results with challenge testing requires an understanding of particle size and particle shape analysis. In his presentation Dr Rideal will examine the basic principles of particle characterisation as they relate to challenge testing of filter media.

Whitehouse Scientific will exhibit its unique range of filter calibration products and services, including the new ShapeSizerTM Image Analyser, on Stand G10 Hall 11.1 at FILTECH 2015. The company has been relied upon around the world as a provider of high quality particle sizing standards and calibration microspheres for more than 30 years. The company provides standards for techniques that include laser diffraction, Coulter methods, optical sizing, sieve calibration and image analysis.  The results are highly reproducible and traceable to international standards such as NIST.

The FILTECH 2015 Conference is the largest event worldwide that is devoted entirely to filtration and separation technology. This year it features 180 papers and 350 exhibitors from 27 countries and gives a representative view of the different processes and appliances across those industries.

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