JEOL and Digital Surf Partner to Launch SMILE VIEW

publication date: Jun 18, 2018
 | 
author/source: JEOL USA, Inc.

JEOLSpecifically designed for Scanning Electron Microscope users

Leading high-tech equipment company JEOL and Digital Surf, creator of Mountains® surface and image analysis technology, have announced the release of SMILE VIEW™ Map software for users of JEOL’s cutting-edge scanning electron microscope (SEM) systems.

This new release will be of great benefit to researchers and engineers working in a wide range of application areas including nanotechnology, metals, semiconductors, ceramics, medicine and biology.

SMILE VIEW™ Map gives users access to a powerful set of features for visualizing, analyzing and reporting their data including:

SMILE VIEW™ Map is a highly accurate tool for SEM data imaging, analysis and metrology. The new software is set to greatly enhance customer experience and will provide the JEOL SEM community worldwide with an extensive selection of tools, all consolidated in one easy-to-use software interface.


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