University of Delaware receives tenth anniversary
shipment
Carl Zeiss Microscopy,
a company of the Carl Zeiss Group and leading provider of light, laser-scanning
and electron and ion beam microscopes, today announced the celebration of its
tenth anniversary of the CrossBeam
© FIB-SEM technology.
In
honor of the tenth anniversary, a ceremony was held at the Center for Composite
Materials at the
University of Delaware, who have
acquired an
AURIGA 60 CrossBeam workstation. The system is the first
major acquisition intended for the University´s new Interdisciplinary Science
and Engineering Laboratory (ISE Lab), now under construction. When completed,
the ISE Lab will house their new AURIGA 60 CrossBeam FIB-SEM instrument and
provide nearly 200,000 square feet of space for hands on research and
education. According to Dr. David Martin, Chair of Materials Science and
Engineering, "This multipurpose analytical instrument is an excellent
demonstration of the interdisciplinary research opportunities that will be
provided by the ISE Lab. The microscope will be open to use by all members of
the University of
Delaware community, as
well as our partners in industry, government laboratories and neighboring
academic institutions."
"The
versatile, flexible AURIGA CrossBeam system has become the most successful
FIB-SEM instrument ever produced by Carl Zeiss," said Michael Rauscher,
Director of the Product Segment CrossBeam. "We are proud of our
accomplishments, and we are proud of the fact that the University of Delaware
has chosen to equip its laboratories with the AURIGA CrossBeam FIB-SEM
technology and to help us celebrate the tenth anniversary of this pioneering
product."
Considered by users as
the industry´s most versatile FIB-SEM workstation, the AURIGA instrument
includes both a GEMINI® scanning electron microscope (SEM) column and a focused
ion beam (FIB) column. The SEM column enables the AURIGA to create superb, high
resolution, nano scale images, while the FIB column enables the tool to remove
material from the sample by ion-milling. In fact, by automatically combining
several images, a complete 3D-model of the sample can be created. Moreover the
AURIGA can also be used to deposit material to the sample by means of various
pre-cursor gases.
These capabilities make
the AURIGA ideally suited for today's materials research with its great
complexity of challenging tasks including high resolution imaging, chemical
composition analysis, crystallographic orientation and electrical attributes.
The tool is also superbly suited for life science research applications, e.g.
in the growing field of brain-mapping.
Some of today's most
demanding applications being handled by the AURIGA include:
-
TEM Sample
Prep
- nanopatterning
- 3D
Analytics including simultaneous 3D EDS and 3D EBSD
- analysis of
hydrocarbon deposits in shale rock
- 3D brain
mapping and reconstruction
For further information about AURIGA visit www.smt.zeiss.com/auriga60
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